Abstract: Uranium thin film prepared by ion plating was characterized on aspects of valances, components, morphology and compact texture, with X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results indicate that uranium thin film on the stainless steel matrix is continuous and consists of UO₂, metal U and FeUO₄. The analysis also reveals that the crystal structure of thin film is a face-centered cubic.