ICPMS法测量~(126)Sn半衰期
MEASUREMENT OF HALF-LIFE OF ~(126) Sn BY ICP-MS
-
摘要: 应用电感耦合等离子体质谱法 (ICP MS)测量了长寿命裂片产物核素12 6Sn的半衰期。用乙醚从高放废液 0 1mol/LHCl 1.0mol/LNH4 SCN介质中无载体分离12 6Sn后 ,对样品进行处理 ,准确分样 ,一份样品直接用ICP MS仪测定12 6Sn的浓度 ,推算出分样前溶液中12 6Sn的原子数 ;另一份样品加一定量的Sn载体进一步纯化制源 ,用HPGeγ谱仪测量12 6Sn活度 ,推算出分样前溶液中12 6Sn活度。按照原子数和放射性活度公式计算出12 6Sn的半衰期值为 (2 48± 0 2 6 )× 10 5a。Abstract: The half life of the long lived fission product 126 Sn has been measured by Inductively Coupled Plasma Mass Spectrometry(ICP MS). The dietheyl ether is used as an extractant to separate carrier free 126 Sn from high level radioactive liquid waste diluted in 0.1 mol/L HCl 1.0 mol/L NH 4SCN medium. The 126 Sn sample is divided into two portions, one for measuring the 126 Sn activity by HPGe γ spectrometer, and the other for measuring the number of 126 Sn nuclei by ICP MS. The portion for activity measurement has been further purified through a radiochemical procedure with Sn carrier before γ spectrum is measured. The obtained value of the half life of 126 Sn is (2.48±0.26)×10 5 a.