Abstract: The necessity of the development of new generation of certified reference materials (CEMs) and the role that NAA will play in the certification of those CRMs are discussed. In conclusion, the major role of NAA in the metrology of contemporary inorganic trace analysis is summarized: the international recognition of NAA as a primary ratio method will imply a major conrtibution to the improvement of CEMs; the concurrent use of k_0-NAA will further strengthen the position of relative NAA as a primary ratio method; and NAA will play an irreplaceable role in the creation of new generation of CRMs, that will eventually lead the establishment of quality control system for microanalysis.