~(132)I半衰期的测量
Measurement of Half-life of ~(132)I
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摘要: 采用位置接力法和HPGeγ谱仪跟踪测量132I的半衰期。位置之间的交替测量避免了效率刻度,设定每次跟踪测量的真时间相等,简化数据处理,并用平移和迭代两种方法进行数据处理。实验测得132I的半衰期为(2.283±0.002)h,经检验数据可靠。Abstract: The half-life of ~(132)I is measured with a HPGe detector by a place-relay method.Calibrating efficiency can be avoided by counting alternately at different places.In order to simplify the dealing process of data,the realtime of every count is set the same.Two ways of iteration and translation are adopted to deal with the data.The obtained value of half-life of ~(132)I is(2.283±0.002) h.The value is checked and proved credible.