XPS CHARACTERIZATION OF THE ANODIC OXIDE FILM FORMED ON URANIUM METAL IN SODIUM HYDROXIDE SOLUTION[J]. Journal of Nuclear and Radiochemistry, 2002, 24(2): 65-65.
    Citation: XPS CHARACTERIZATION OF THE ANODIC OXIDE FILM FORMED ON URANIUM METAL IN SODIUM HYDROXIDE SOLUTION[J]. Journal of Nuclear and Radiochemistry, 2002, 24(2): 65-65.

    XPS CHARACTERIZATION OF THE ANODIC OXIDE FILM FORMED ON URANIUM METAL IN SODIUM HYDROXIDE SOLUTION

    • X ray photoelectron spectroscopy (XPS) is used to examine the anodic oxide film formed on uranium metal in 0.8 mol/L NaOH solution. The U4 f 7/2 fitting spectra suggests that the anodic oxide film is composed of uranium trioxide and a small amount of UO 2+ x . Under UHV condition, the U4 f peak shifts to the lower binding energy, while a gradual increase in the intensity of U5 f peak and the broading of U4 f peak are also observed. All of these changes are due to reduction of uranium trioxide in the anodic oxide film. XPS quantitative analysis confirms the occurrence of reduction reaction.
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