Measurement of Half-life of ~(132)I
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Graphical Abstract
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Abstract
The half-life of ~(132)I is measured with a HPGe detector by a place-relay method.Calibrating efficiency can be avoided by counting alternately at different places.In order to simplify the dealing process of data,the realtime of every count is set the same.Two ways of iteration and translation are adopted to deal with the data.The obtained value of half-life of ~(132)I is(2.283±0.002) h.The value is checked and proved credible.
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